Path Reliability in Automated Test Case Generation Process
| dc.contributor.author | Choudhary, Kavita | |
| dc.contributor.author | Rani, Payal | |
| dc.contributor.author | Shilpa | |
| dc.date.accessioned | 2017-06-14T07:53:40Z | |
| dc.date.available | 2017-06-14T07:53:40Z | |
| dc.date.issued | 2016 | |
| dc.description.abstract | Path Reliability in Automated Test Case Generation Process. International Conference INDIA-2016 | en_US |
| dc.identifier.citation | Kavita Choudhary, Payal Rani and Shilpa (2016). Path Reliability in Automated Test Case Generation Process. International Conference INDIA-2016, Advances in Intelligent Systems and Computing | en_US |
| dc.identifier.uri | http://hdl.handle.net/123456789/2500 | |
| dc.language.iso | en | en_US |
| dc.publisher | SPRINGER | en_US |
| dc.subject | Path Reliability | en_US |
| dc.title | Path Reliability in Automated Test Case Generation Process | en_US |
| dc.type | Article | en_US |