Reliability Characterization for Embedded System with N- Version programming
| dc.contributor.author | Kaushik, M | |
| dc.contributor.author | Kumar, Gireesh | |
| dc.date.accessioned | 2016-05-25T12:10:58Z | |
| dc.date.available | 2016-05-25T12:10:58Z | |
| dc.date.issued | 2014 | |
| dc.identifier.citation | M. Kaushik and Gireesh Kumar (2014). Reliability Characterization for Embedded System with N- Version programming. Special issue of International Journal of Engineering and Technical Research, pp. 372-374. | en_US |
| dc.identifier.uri | http://hdl.handle.net/123456789/1276 | |
| dc.language.iso | en | en_US |
| dc.publisher | International Journal of Engineering and Technical Research | en_US |
| dc.title | Reliability Characterization for Embedded System with N- Version programming | en_US |
| dc.type | Article | en_US |