Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process
| dc.contributor.author | Jain, Madhu | |
| dc.contributor.author | Kaushik, Manju | |
| dc.contributor.author | Kumar, Gireesh | |
| dc.date.accessioned | 2016-06-03T11:50:50Z | |
| dc.date.available | 2016-06-03T11:50:50Z | |
| dc.date.issued | 2015 | |
| dc.identifier.citation | Madhu Jain, Manju Kaushik and Gireesh Kumar (2015). Reliability Analysis for Embedded System with Two Types of Faults and Common Cause FailureUsingMarkov process.ICCCT'15Proceedings of the Sixth International Conference on Computer and Communication Technology 2015, 271-275. | en_US |
| dc.identifier.uri | http://hdl.handle.net/123456789/1400 | |
| dc.language.iso | en | en_US |
| dc.publisher | Sixth International Conference on Computer and Communication Technology | en_US |
| dc.title | Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process | en_US |
| dc.type | Article | en_US |